Cypress Semiconductor put together a nice book a couple of years ago on
the topic of single effect events (SEE) which you might be able to find in
one of your libraries
<http://www.cypress.com/?rID=14793>
Chuck Petras, PE**
Schweitzer Engineering Laboratories, Inc
Pullman, WA 99163 USA
http://www.selinc.com
Tel: +1.509.332.1890
SEL Synchrophasors - A New View of the Power System < https://www.selinc.com/synchrophasors/>
Making Electric Power Safer, More Reliable, and More Economical (R)
From: Peter Bernard Ladkin <ladkin_at_xxxxxx
To: "Higham, Dave" <Dave.Higham_at_xxxxxx Cc: "systemsafety_at_xxxxxx<systemsafety_at_xxxxxx Date: 04/11/2013 08:27 AM
On 4/11/13 4:59 PM, Higham, Dave wrote:
> There are some references to studies in this online presentation, that
may be of use:
> http://www.ewh.ieee.org/r6/scv/rl/articles/Soft%20Error%20mitigation.pdf
Thanks! That's soft errors - flipping. There is also latching, which is
more problematic when it
happens. The MOSFET issues were due to latching.
PBL
Prof. Peter Bernard Ladkin, Faculty of Technology, University of
Bielefeld, 33594 Bielefeld, Germany
Tel+msg +49 (0)521 880 7319 www.rvs.uni-bielefeld.de
This archive was generated by hypermail 2.3.0 : Sun Feb 17 2019 - 16:17:05 CET